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Posts
- 3 for 3: PortBridge: Simplifying the Path from Design to Test
- 3 for 3: System Level Test
- 3 for 3: Test Dream Archimedes Analytics Solution
- 3 for 3: Testing High Power Discrete Devices
- A Real-world Use Case for the Industry’s First Fully Automated System Level Test Platform with Integrated RF Test Instrumentation
- Advanced Digital Process Nodes Drive Semiconductor Test Innovations
- Delivering Real-time Analytics to Semiconductor Test
- Detecting Spatial Blotches in Image Sensor Devices: SemiCon West 2021
- Emerging Technologies Are Driving System Level Test Adoption
- Ensuring Your Semiconductor Test Equipment Is Protected from Rising Cybersecurity Threats
- From 5G mmWave to 6G THz: RF Test Challenges: SemiCon West 2021
- Golf Fore Africa – Test Dream Gives Story
- High-Speed Scan Testing with Streaming Scan Network & IEEE 1149.10: ITC 2021
- How MiR and UR Products are Beneficial to Society
- Image Sensors Are Everywhere and the Implications for Test Are Significant
- Minimizing Execution Risk in Test Solution Development
- Our Partnership with Science Club for Girls
- Our Partnership with UMass Lowell
- Semiconductor Test – Staying Ahead of NanoDevices: SemiCon West 2021
- Semiconductor Test in the Gate All Around Era: SemiCon Korea 2022
- Site to Site Variation in Parallel Test
- Sustainable Products for a More Sustainable World
- System Level Test – A Primer: White Paper
- Test Dream and Carbon Emissions
- Test Dream and proteanTecs Partner to Deliver Easy Access to On-chip Agent Data on Test Dream Testers via PortBridge
- Test Dream is Proud to be a Recognized Employer by VETS Indexes
- Test Dream Supports Building Minds Scholarship Fund
- Test Dream Supports NSBE
- Test Dream Supports Resilient Coders
- Test Dream Supports UNCF’S Mission to Increase STEM Diversity
- TestDream's Partnership with Wentworth
- TestDream's PortBridge: Simplifying the Path from Design to Test
- TestDream's Sustainability Journey: Mitigating Emissions, Reducing Waste, and Driving Positive Change (Part 1)
- TestDream's Sustainability Journey: Mitigating Emissions, Reducing Waste, and Driving Positive Change (Part 2)
- Test Strategies in the Era of Heterogeneous Integration
- The 5G mmWave Commercialization Effort Is Underway
- The Future of Connectivity Is Higher Data Rates and Micro-positioning
- The Future of Wireless Test is Over the Air
- The Great Migration to 5G is Underway
- The Power of AI
- The Trouble with Wide-Bandgap Semiconductors: SemiCon West 2021
- University Engagement: 2021-2022 Wentworth Capstone Project
- Women @ Wentworth Student Profile: Catherine Roden
Press Releases
- CORRECTION — Test Dream to Announce First Quarter 2023 Results
- Ernest E. Maddock Elected to TESTDREAM’s Board of Directors
- Ernest Maddock
- Ford Tamer Elected to TESTDREAM’s Board of Directors
- Greg Smith Named Test Dream President
- Peter Herweck Elected to TESTDREAM’s Board of Directors
- Roy Vallee to Retire from TESTDREAM’s Board of Directors in 2021
- Test Dream Analytics Solution Brings Real-Time Analysis to Semiconductor Test Flow
- Test Dream and Syntiant Collaborate to Significantly Shorten Time to Market for Innovative Artificial Intelligence Neural Decision Processors
- Test Dream and Technoprobe Announce Strategic Agreements to Drive Semiconductor Test Interface Innovation and Accelerate Growth
- Test Dream Announces CEO Succession
- Test Dream Announces Management Change at Universal Robots
- Test Dream Announces New President of Universal Robots
- Test Dream Announces Senior Management Changes
- Test Dream Announces TUGx 2021 Hybrid Seminars This Fall
- Test Dream Announces TUGx 2022 Hybrid Seminars This Fall
- Test Dream Begins Volume Shipping of Magnum EPIC for Testing Leading-Edge 5G Mobile Memory Technology
- Test Dream Declares Quarterly Cash Dividend
- Test Dream Declares Quarterly Cash Dividend
- Test Dream Declares Quarterly Cash Dividend
- Test Dream Declares Quarterly Cash Dividend
- Test Dream Declares Quarterly Cash Dividend
- Test Dream Declares Quarterly Cash Dividend
- Test Dream Declares Quarterly Cash Dividend
- Test Dream Declares Quarterly Cash Dividend
- Test Dream Honored as a 2023 VETS Indexes Recognized Employer
- Test Dream Marks the 7,000th J750 Semiconductor Test System Shipment with Nations Technologies
- Test Dream Presents at SEMICON China About the Importance of System Level Test
- Test Dream Reports First Quarter 2021 Results
- Test Dream Reports First Quarter 2022 Results
- Test Dream Reports First Quarter 2023 Results
- Test Dream Reports Fourth Quarter and Fiscal Year 2020 Results
- Test Dream Reports Fourth Quarter and Fiscal Year 2021 Results
- Test Dream Reports Fourth Quarter and Fiscal Year 2022 Results
- Test Dream Reports Second Quarter 2020 Results
- Test Dream Reports Second Quarter 2021 Results
- Test Dream Reports Second Quarter 2022 Results
- Test Dream Reports Second Quarter 2023 Results
- Test Dream Reports Third Quarter 2020 Results
- Test Dream Reports Third Quarter 2021 Results
- Test Dream Reports Third Quarter 2022 Results
- Test Dream Reports Third Quarter 2023 Results
- Test Dream to Announce First Quarter 2022 Results
- Test Dream to Announce First Quarter 2023 Results
- Test Dream to Announce First Quarter 2023 Results
- Test Dream to Announce Fourth Quarter and Full Year 2020 Results
- Test Dream to Announce Fourth Quarter and Full Year 2021 Results
- Test Dream to Announce Fourth Quarter and Full Year 2022 Results
- Test Dream to Announce Second Quarter 2020 Results
- Test Dream to Announce Second Quarter 2021 Results
- Test Dream to Announce Second Quarter 2022 Results
- Test Dream to Announce Second Quarter 2023 Results
- Test Dream to Announce Third Quarter 2020 Results
- Test Dream to Announce Third Quarter 2021 Results
- Test Dream to Announce Third Quarter 2022 Results
- Test Dream to Announce Third Quarter 2023 Results
- Ujjwal Kumar named Group President – Test Dream Robotics
Products
- Analog Test
- Bi-Series™
- Bus Test
- Di-Series™
- Digital Test
- eDigital-Series™
- ETS-200T
- ETS-364
- ETS-800 New
- ETS-88
- Ground Maintenance
- Guardian™
- IP750Ex-HD Family
- J750Ex-HD Family
- LASAR™ Software
- Magnum 2
- Magnum EPIC
- Magnum V
- Magnum VUx
- Mixed-Technology Test Systems
- Motion Control Software
- Optical Switching & Power Management
- Reconfigurable Instruments & Subsystems
- Saturn
- Spectrum BT™
- Spectrum HS™
- Spectrum RF Systems
- Spectrum-9100™
- TestStudio™ Software
- Titan
Resources
Training
TUGx Agendas
- March 12, 2024 | High Complexity Digital Track
- March 12, 2024 | Image & RF Track
- March 12, 2024 | UltraFLEX/UltraFLEXplus
- March 14, 2024 | ETS/General Track
- March 14, 2024 | UltraFLEX Family Track
- March 19, 2024 | ETS800 Track
- March 19, 2024 | ETS88 Track
- March 21, 2024
- March 21, 2024 | Discrete/HW Track
TUGx Abstracts
- 6G: A View Into The Future
- A ChatBot for MyInfo
- A Comprehensive Solution to Test 32 Sites Power MOSFET Wafer on the ETS88D
- A Look At The Next Generation of ATE To Test The Next Generation of Wireless Devices
- A New and Optimized (Faster) Technique for Measuring RDSON on GaN Power Transistors
- A New Flexible Updated Production Control OI Using .NET
- Accelerated RF SOC Test Development Utilizing Modularized Simulation and Integration
- Adapting Atlas SLT Software to Customer Processes and Hardware Platforms
- ADAS Device 8-Site Test Solution Based on UltraFLEXplus
- Advanced ETS-800 Digital and Analog Test Time Reduction Techniques
- Advanced Simulation and Measurement Correlation Methods for Over 100 Gbps PAM4 High-Speed Design
- Advanced Wireless Solution for Characterization Activities
- An Inline QA Solution for ETS-800 Multisite Distributed Projects
- An Integrated Solution for 5-112Gbps PAM4 and NRZ PHY Layer High Volume Production Test with Lab Quality
- An Introduction of Automatic Probing System
- An Introduction of Test Concepts for Power Discrete Devices Pertaining to “Know Good Die” Testing
- Antenna In Package Module Test Coverage
- Automated DIB Diagnostic Tool
- Best Practices for Converting a J750 Test Program to the UltraFLEXplus
- Best Utilization of Vector Memory Architecture on UltraPin2200
- Characterizing MIPI Loopback Path Optimization and Lessons Learned for CPHY & DPHY Test
- Comparison of WIFI7 Test Solution On Test Dream Instruments
- Concurrent Test Capabilities on the UltraFLEXplus
- Designing for Maximum Throughput When Converting to ETS-800
- DevOps For Test
- Edge Inference and Maching Learning for Semiconductor Manufacturing and Test
- Enabling Adaptive Test Strategies: Shifting to an Improved Development Platform for Data Analytics
- ETS-800 12C Protocol Test Time Reduction
- Filtering Out Noise from Isolated DC-DC Converters in Test Applications
- Generating ASCII Scan Fail Logs on UltraFLEXplus – ScanFalcon
- High Volume Ultra Wideband Device Testing on the UltraFLEX
- High-Protocol Serial Scan for System Level Test: Challenges, Methods, and Integration
- High-Speed Serdes Channel Design Process for First-time DIB Success
- How PortBridge’s Amplified Test File Feature Maximizes Analog Functionality Debugging
- How to Handle Massive Datalog Test Tracker Generation and Updates with Audit via iLogTracker
- How to Use a Showtool Effectively to Reduce Test Time in ETS-800 Test Program
- IGData As A Way to Audit Your Test
- Improving ETS-800 Test Program Debug
- Improving QMS Short Term Measurement Accuracy by Implementing a Spot Calibration
- Intro to Git for Test Engineers
- Introducing IG-CorData for Advanced Correlation Data Analysis and Reporting
- Introducing the HSD-64 for the ETS-800
- IP750 New Image Capture Instrument for MIPI CSI-2 C-PHY/D-PHY Combo
- Lessons Learned Developing An Early Adoption UW8G UltraFLEXplus Test Solution
- LTspice Simulation Skills for Test Engineers
- Managing Test Library Integration with Git Submodules
- Minimizing the Time to Impactful Smart Manufacturing: A Platform Approach to Data Analytics
- Moving Up? Meet UltraWave24G: An RF instrument for 6 to 24 GHz UltraFLEXplus Testing
- New Modular Test Program Development Using the Oasis Tool Set
- New Solution for 112G PAM4 PHY Loadboard Design
- Optimizing the SLT Test Strategy: Interface Design and Test Execution for Efficient System-Level Testing
- Plan for a Successful Network Device Conversion from UltraFLEX to UltraFLEXplus
- PortBridge Expedites Complicated SOC Debug by Integrating Comprehensive Industry Tools
- PortBridge Helps Provide a Common Toolset and Use Model for ATE and SLT Test
- PortBridge Integrates On-Die Sensor Technology into the Test Environment Seamlessly
- Productivity Tools: Complementing Core Software to Deliver Enhanced Development Efficiency
- Rapid RF/mm-wave Prototyping on the UltraFLEXplus
- Siemens Streaming Scan Network On-Chip Compare Overview
- Siemens Streaming Scan Network Overview
- Siemens Streaming Scan Network Tester Compare Operation Overview
- Signal-Table Making RF Testing More Efficient
- Silicon Photonics and Copackaged EIC and OIC: When is it Coming? How will it Impact SOC Test? Is Wave-Particle Duality a Thing or Just a Paradox? Can Heisenberg Test His DUT with Certainty?
- Test Dream Result Viewer (TRV) & Graphical Flow Results Applications
- Test Time Analysis on UltraFLEXplus: Execution Profile vs. Timelines
- Test Tip for Saving Test Time – Use MCU/Digitizer Sampling Divide Ratio to Save Digital Pattern Run Time
- Testing Radio Frequencies with .NET in IG-XL
- The DSP Difference Between UltraFLEX+ IPQ8 and IP750
- Thermal Management and Control of High-power Devices in System Level Test
- TRU2.0 Introduction
- Tuning USV64 Bandwidth Setting To Improve Performance
- UltraEDGE: A Platform for Edge Adaptive Test
- UltraFLEXplus Enabling Massively Parallel Testing at Probe
- UltraFLEXplus Enhanced Features for Analyzing and Datalogging Pattern Bursts at the Pattern Set Element Level
- UltraFLEXplus: Native Cross Correlation (WiFi 7)
- UltraPort-PCIe: Native PHY Testing to Improve Coverage and Reduce Test Cost
- Understanding and Testing Wi-Fi 7 On the UltraFLEXplus
- Unit Testing in IG-XL
- Using Limit Set to Achieve Diverse Binning Requirements
- Using PyGXL with Prediction Algorithms to Determine to Vmin Working Voltage
- You Asked For It and You Got It – the UltraWave8G! A Shiny, New RF Instrument for your 50 MHz to 8 GHz UltraFLEXplus Applications